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Microwave Journal podcasts including the RF/microwave update series, Frequency Matters, plus interviews with industry experts and executives.
Episodes
Jun 16, 2022
Jun 16, 2022
25 min
Joel Dunsmore, Research Fellow at Keysight Technologies and RF test expert, book author and course instructor with more than 36 patents, talks with Microwave Journal Media Director, Pat Hindle, about his design work with various VNAs over the years, software and algorithm development, patent research and future outlook on the industry.
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