Microwave Journal Podcasts

Microwave Journal Media Director, Pat Hindle, covers the articles in the March Test and Measurement issue, reviews industry news, and provides a summary of DesignCon and Mobile World Congress Barcelona. Sponsored by RFMW.

Gokhan Yaliniz, Product Line Manager, RF and mmW for Communications at Analog Devices, talks with Pat Hindle about the status of 5G mmWave applications including FWA and private networks. Sponsored by Analog Devices.

Microwave Journal Editor Pat Hindle reviews the products in the Feb Satellite and Radio Communications themed issue, talks with ADI about 5G mmWave applications, and review industry news and events. Sponsored by Analog Devices.

Ian Dunn, CTO of Spectrum Control, talks with Pat Hindle about their evolution into subsystems to meet the changing military customer needs. Ian talks about RF integration, system responsibility, open systems and reducing time to deployment. Sponsored by Spectrum Control.

Microwave Journal editors Pat Hindle and Del Pierson review the products in the Jan Radar/Antenna themed issue, talk with Ian Dunn, CTO of Spectrum Control, about RF architecture evolution and review industry news/events. Sponsored by RFMW and Spectrum Control.

Microwave Journal editors Pat Hindle and Del Pierson review the technical articles in the Jan Radar and Antennas themed issue, industry news and CES 2026. Sponsored by RFMW.

Microwave Journal editors Pat Hindle and Del Pierson put on their elves' hats and review the most viewed articles of 2025 featuring the AI Grinch, discuss the products in the Dec Gov't and Military Electronics themed issue and review the latest industry news and events. Sponsored by RFMW.

Baljit Chandhoke, Product Manager of RF Products at Microchip, talks with Pat Hindle about RF and microwave signal chain trends in applications such as 5G, A&D and SATCOM and how Microchip's broad portfolio is meeting the needs of design engineers. Sponsored by Microchip.

Microwave Journal editors Pat Hindle and Del Pierson review the technical articles in the Dec Gov't and Military Electronics themed issue, interview Microchip about innovations in the signal chain, and review industry news and events. Sponsored by RFMW and Microchip.

Microwave Journal editors Pat Hindle and Del Pierson explore the history of VNAs and other testing technologies at Keysight Technologies that lead up to development of a full vector component testing system at 330 to 500 GHz shown at IMS this year by talking with Joel Dunsmore, Research Fellow at Keysight Technologies.