Microwave Journal editors Pat Hindle and Gary Lerude discuss the technical articles in the Aug mmWave Technology and EuMW themed issue, industry news and EuMW 2022 coming up in Sept in Milan. Sponsored by RFMW.
Microwave Journal Editors Pat Hindle and Gary Lerude discuss the July Software and Design issue products, latest industry news, with a focus on the Farnborough Airshow releases, and upcoming events. Sponsored by RFMW.
Christophe Massenet, VP of Engineering and Business Development at RF Industries, talks with Pat Hindle, Media Director at Microwave Journal, about their new RF transparent concealment covering, TruField, that protects RF systems, is RF transparent to 50 GHz, and easy to install.
Jerome Patoux, Director of Marketing, Aerospace and Defense at Analog Devices, talks with Pat Hindle, Media Director at Microwave Journal, about the evolution of AESA radar, tradeoffs in architectures and impact of GaN technology. Sponsored by Analog Devices.
Tom Sarfi, Business Development Manager at Pickering Interfaces, talks with Pat Hindle, Media Director at Microwave Journal, about the trends in the general testing market, various types of switching systems, the advantages and challenges in implementing switching systems for automated testing, and the outlook for future improvements in automated testing systems. Sponsored by Pickering Interfaces.
Pat Hindle, Media Director at Microwave Journal, and guest co-host Kim Boucher, Technology Executive and MIT Senior Lecturer of Entrepreneurship, discuss the July Software and Design issue articles plus IMS 2022 in the annual beach episode on Plum Island. Sponsored by RFMW and Times Microwave.
David Slack, Director of Engineering at Times Microwave, talks with Gary Lerude, Editor at Microwave Journal, about the hypersonic market and the challenges for RF and microwave companies in various hypersonic applications. Sponsored by Times Microwave.
Brian Woods, VP of EM Solutions at Altair, talks with Pat Hindle, Microwave Journal Media Director, about the Altair platform of products and highlights of the 2022 release of Altair FEKO. Sponsored by Altair.
Microwave Journal editors Pat Hindle and Gary Lerude discuss the June Semiconductor/RFIC themed issue articles, preview the June Aerospace and Defense supplement, interview Altair about FEKO 2022 plus industry news and IMS 2022. Sponsored by Altair.
Joel Dunsmore, Research Fellow at Keysight Technologies and RF test expert, book author and course instructor with more than 36 patents, talks with Microwave Journal Media Director, Pat Hindle, about his design work with various VNAs over the years, software and algorithm development, patent research and future outlook on the industry.