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Microwave Journal podcasts including the RF/microwave update series, Frequency Matters, plus interviews with industry experts and executives.
Episodes
Oct 11, 2019
Oct 11, 2019
13 min
Microwave Journal editors Pat Hindle and Gary Lerude review EuMW products at the event and talk with David Vye of NI/AWR & Eric LeClerc of UMS about their collaboration on GaN device modeling/simulation. Sponsored by NI/AWR.
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