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Microwave Journal podcasts including the RF/microwave update series, Frequency Matters, plus interviews with industry experts and executives.
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Tuesday Dec 02, 2025
Tuesday Dec 02, 2025
Microwave Journal editors Pat Hindle and Del Pierson explore the history of VNAs and other testing technologies at Keysight Technologies that lead up to development of a full vector component testing system at 330 to 500 GHz shown at IMS this year by talking with Joel Dunsmore, Research Fellow at Keysight Technologies.
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