Microwave Journal Podcasts

Microwave Journal editors Pat Hindle and Gary Lerude discuss the Oct Passive & Control Components issue technical articles, industry news and busy event schedule.

Randy Cochran, Product Marketing Manager for MMIC and LTCC products, and Raj Santhakumar, MMIC Product Line Engineer, at Mini-Circuits talks with Pat Hindle, Media Director, at Microwave Journal about MMIC market trends and the unique MMIC solution that Mini-Circuits is developing. Sponsored by Mini-Circuits.

Microwave Journal editors Pat Hindle and Gary Lerude review the September Military and Aerospace issue articles and products, interview Mini-Circuits MMIC experts, industry news, and upcoming events. Sponsored by Mini-Circuits.

Microwave Journal editors Pat Hindle and Gary Lerude discuss the Sept automotive/connected vehicles themed issue articles, industry news and upcoming events.

Microwave Journal editors Pat Hindle and Gary Lerude review the products in the August mmWave and EuMW themed issue, industry news and upcoming events. Sponsored by RFMW.

Microwave Journal editors Pat Hindle and Gary Lerude discuss the technical articles in the Aug mmWave Technology and EuMW themed issue, industry news and EuMW 2022 coming up in Sept in Milan. Sponsored by RFMW.

Microwave Journal Editors Pat Hindle and Gary Lerude discuss the July Software and Design issue products, latest industry news, with a focus on the Farnborough Airshow releases, and upcoming events. Sponsored by RFMW.

Christophe Massenet, VP of Engineering and Business Development at RF Industries, talks with Pat Hindle, Media Director at Microwave Journal, about their new RF transparent concealment covering, TruField, that protects RF systems, is RF transparent to 50 GHz, and easy to install.

Jerome Patoux, Director of Marketing, Aerospace and Defense at Analog Devices, talks with Pat Hindle, Media Director at Microwave Journal, about the evolution of AESA radar, tradeoffs in architectures and impact of GaN technology. Sponsored by Analog Devices.

Tom Sarfi, Business Development Manager at Pickering Interfaces, talks with Pat Hindle, Media Director at Microwave Journal, about the trends in the general testing market, various types of switching systems, the advantages and challenges in implementing switching systems for automated testing, and the outlook for future improvements in automated testing systems. Sponsored by Pickering Interfaces.